SEMICONDUCTOR X-RAY DETECTORS

Features Focuses on the history and development of Si(Li) X-Ray Detectors Describes all facets of x-ray detection and measurement using semiconductors Reviews relevant background physics, materials science, and engineering aspects Covers the properties and manufacture of currently used systems and materials Compare and contrasts each system so that readers fully understand the materials and scope for applications Summary Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to the background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems.